TY  - JOUR 
T1  - A Highly Accurate Formulation for the Analysis of Perturbed Cavities in SIW Technology
JO  - Journal of Microwaves, Optoelectronics and Electromagnetic Applications
A1  - Reis, Denis Q.
A1  - Caleffo, Ricardo C.
A1  - Ferreira, Daniel B.
A1  - Nascimento, Daniel C.
SN  - 2179-1074
UL  - 10.1590/2179-10742026v25i2301540
VL  - 25 
Y1  - 2026
PB  - Brasil 
ER  -