@article{reis_caleffo_ferreira_nascimento_2026,  title={A Highly Accurate Formulation for the Analysis of Perturbed Cavities in SIW Technology},  volume={25},  ISSN={2179-1074},  url={https://doi.org/10.1590/2179-10742026v25i2301540},  DOI={10.1590/2179-10742026v25i2301540},  number={2},  journal={Journal of Microwaves, Optoelectronics and Electromagnetic Applications},  publisher={Sociedade Brasileira de Microondas e Optoeletrônica e Sociedade Brasileira de Eletromagnetismo},  author={Reis, Denis Q. and Caleffo, Ricardo C. and Ferreira, Daniel B. and Nascimento, Daniel C.},  year={2026},  pages={e2026301540} }